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وزارة التعليم العالي و البحث العلمي

Research centre in Industrial Technologies -CRTI- EChahid Mohammed ABASSI

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FINITE ELEMENT ANALYSIS OF AlN/Si THIN FILM RESONATOR

Type: Conference Paper
Year: 2015
Domain: Physics
Authors: F.LAIDOUDI, A. Reddaf, F.Boubenider
Keywords
Surface acoustic wavethin film resonatorFEM analysis
Abstract

This paper aim to study the influence of thin film thickness on the surface acoustic wave and reflectivity in AlN/Si resonator with Al electrodes, using finite element analysis. Mode shapes of the device as a function of frequency thickness were presented and results were obtained to optimize the design of SAW thin film devices that can work in high frequency.